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Intellectual leverage for the information society : digest of papers, Compcon Spring 83, Twenty-sixth IEEE Computer Society International Conference, Cathedral Hill Hotel (formerly Jack Tar), San Francisco, California, February 28-March 3

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索取号：TP3-53/E9033/26
作者：Compcon (26th : 1983 : San Francisco、 Calif.)、IEEE Computer Society.、
出版社：New York, NY : IEEE Computer Society ; Los Angeles, CA : Available from IEEE Computer Society ; Piscataway, NJ : Available from IEEE Service Center, 1984,c1983.

High technology in the information industry : digest of papers, Compcon Spring 82, Twenty-fourth IEEE Computer Society International Conference, Jack Tar Hotel, San Francisco, California, February 22-25

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索取号：TP3-53/E9036/24
作者：Compcon (24th : 1982 : San Francisco、 Calif.)、IEEE Computer Society.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Los Alamitos, CA : Available from IEEE Computer Society ; Piscataway, NJ : Available from IEEE Service Center, 1982.

Proceedings

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索取号：TP3-53/E801/4
作者：International Conference on Distributed Computing Systems (4th : 1984 : San Francisco、 Calif.)、IEEE Computer Society.、
出版社：N.Y. Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1984.

Proceedings

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索取号：TP3-53/E801/1
作者：International Conference on Distributed Computing Systems (1st : 1979 : Huntsville、 Ala.)、United States. Army Ballistic Missile Defense Advanced Technology Center.、
出版社：New York : Institute of Electrical and Electronics Engineers, 1979.

Proceedings

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索取号：TP3-53/E9014/1
作者：International Conference on Computer Workstations (1st : 1985 : San Jose、 Calif.)、IEEE Computer Society.、
出版社：Washington, D.C. : IEEE Computer Society Press ; Los Angeles, Calif. : Order from IEEE Computer Society, 1985.

International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton

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索取号：TP274-53/E801/1977
作者：International Conference on New Developments in Automatic Testing、 Brighton、 Eng.、 1977.、Institution of Electrical Engineers. Control and Automation Division.、Institution of Electrical Engineers. Electronics Division.、
出版社：London : The Institution, 1977.

Multivariable control system design and applications : [proceedings of a conference held] 1-3 September 1971, [at the] University of Manchester, Owens Park

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索取号：TP273-53/E808
作者：UKAC Control Convention、 4th、 University of Manchester、 1971.、United Kingdom Automation Council.、Institution of Electrical Engineers.、University of Manchester.、
出版社：London, Institution of Electrical Engineers, 1971.

Adaptive systems in control and signal processing 1983 : proceedings of the IFAC workshop, San Franciso, USA, 20-22 June, 1983

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索取号：TP273-53/E903
作者：
出版社：Oxford [Oxfordshire] ; New York : Published for the International Federation of Automatic Control by Pergamon Press, 1983,c1984.

Proceedings

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索取号：TP252-53/E901/1986.3
作者：IEEE International Conference on Robotics and Automation (1986 : San Francisco、 Calif.)、IEEE Robotics and Automation Council.、IEEE Computer Society.、
出版社：Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1986.

Proceedings

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索取号：TP252-53/E901/1986.2
作者：IEEE International Conference on Robotics and Automation (1986 : San Francisco、 Calif.)、IEEE Robotics and Automation Council.、IEEE Computer Society.、
出版社：Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1986.

Proceedings

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索取号：TP252-53/E901/1986.1
作者：IEEE International Conference on Robotics and Automation (1986 : San Francisco、 Calif.)、IEEE Robotics and Automation Council.、IEEE Computer Society.、
出版社：Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1986.

Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing

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索取号：TP216-53/E901/1985
作者：IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983

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索取号：TP216-53/E902/1983
作者：
出版社：N.J. Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1983.

Autotestcon '82, October 12-14 : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio

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索取号：TP216-53/E901/1982
作者：IEEE International Automatic Testing Conference (1982 : Dayton、 Ohio)、Institute of Electrical and Electronic Engineers.、
出版社：New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982.

Autotestcon '83, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing

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索取号：TP216-53/E901/1983
作者：Autotestcon '83 (1983 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, c1983.

Proceedings of the 1980 Joint Automatic Control Conference : an ASME Century 2 Emerging Technology Conference, August 13-15, San Francisco, California

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索取号：TP13-53/E801
作者：Joint Automatic Control Conference、 San Francisco、 1980.、American Society of Mechanical Engineers.、American Institute of Chemical Engineers.、American Institute of Aeronautics and Astronautics.、Society of Manufacturing Engineers.、American Automatic Control Council.、
出版社：[New York] : Published on behalf of the American Automatic Control Council [by the American Society of Mechanical Engineers], 1980.